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  • Silicon photonic chip wafer-level test system
    Silicon photonic chip wafer-level test system
    Compatible with 4-, 6-, 8-, 10-, and 12-inch wafer testing.High-temperature chuck configuration enables testing from ambient to 200°C (low-temperature requires nitrogen flow 480 L/min, and a -40°C t
  • High speed signal integrity testing system
    High speed signal integrity testing system
    The Xuece high-speed signal integrity testing system supports one click testing of cables such as MiniSAS internal/external ports, MiniSAS HD internal/external ports, SFP+, SFP28, QSFP+, QSFP28, PCIE,
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