Home
Products
Optical Attenuator
Multi channel single-mode optical attenuator
Multi-channel multimode optical attenuator
Light Source
Multi wavelength light source(DFB)
Multi wavelength light source(SLED)
ASE Broadband light source
Optical Switch
Optical switch
Optical Power Meter
Multi-channel optical power meter
Optical Clock Recovery Device
Optical clock recovery device(CDR)
800G Integrated Error Code Analyzer
800G integrated error code analyzer
Solutions
Silicon photonic chip wafer-level test system
High speed signal integrity testing system
News
About us
Contact us
中文
Solutions
System solution experts with full-link coverage
Silicon photonic chip wafer-level test system
Compatible with 4-, 6-, 8-, 10-, and 12-inch wafer testing.High-temperature chuck configuration enables testing from ambient to 200°C (low-temperature requires nitrogen flow 480 L/min, and a -40°C t
High speed signal integrity testing system
The Xuece high-speed signal integrity testing system supports one click testing of cables such as MiniSAS internal/external ports, MiniSAS HD internal/external ports, SFP+, SFP28, QSFP+, QSFP28, PCIE,
Total: 2
1
Pages:1/1